• Title of article

    Investigation of interfacial segregation at antiphase boundaries in a ternary alloy 84.8Ni–12.8Al–2.4Ta

  • Author/Authors

    Chen، نويسنده , , C.Y and Schنublin، نويسنده , , R and Stobbs، نويسنده , , W.M، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    9
  • From page
    356
  • To page
    364
  • Abstract
    A thin interphase layer (∼4 nm) between the merging γ′ precipitates in a chosen model alloy 84.8Ni–12.8Al–2.4Ta was investigated. It is demonstrated that interfacial segregation may occur at an antiphase boundary (APB) interface between the thin layer and one of the merging γ′ precipitates. The magnitude of the lattice displacement (about 1/10[010]) caused by interfacial segregation has been measured both by comparing experimental images with computer simulations, and from high resolution electron microscopy (HREM) fringe spacings using linear regressional analysis. These measurements show a consistent lattice spacing reduction across the APB. Image simulations also highlight the way that the contrast of the bounding partial dislocation affects the APB interface image and can be used to obtain the lattice shift across the interface when the segregation effects on α-fringe contrast are significant.
  • Keywords
    Segregation , computer simulations , Antiphase boundary (APB) , Superalloys , High resolution electron microscopy (HREM)
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: A
  • Serial Year
    2003
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: A
  • Record number

    2142934