Title of article :
Temperature dependent conductivity and dielectric properties of Bi2V0.9Cu0.1O5.35 solid electrolyte thin films
Author/Authors :
R.K. Nimat، نويسنده , , R.K. and Joshi، نويسنده , , R.S. and Pawar، نويسنده , , S.H.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
6
From page :
93
To page :
98
Abstract :
Precursors of thin films were deposited on alumina substrates at temperature of 250 °C using spray pyrolysis technique and BICUVOX phase obtained after annealing at 650 °C. Thermal decomposition behavior of BICUVOX precursor was studied using TGA–DTA technique. It reveals that formation of oxide phase takes place beyond 630 °C. X-ray diffraction and SEM techniques were employed for structural and surface morphological characterizations, respectively. These studies reveal that the films are polycrystalline in nature and consist of the desired phase of Bi2V0.9Cu0.1O5.35 suitable for solid oxide fuel cells. The electrical conductivity and the dielectric properties of Bi2V0.9Cu0.1O5.35 thin films were investigated as a function of temperature (30–400 °C) in the frequency range 20 Hz to 1 MHz using impedance spectroscopy which reveals that the present electrolyte film can be used to form low temperature solid oxide fuel cells.
Keywords :
SOFC , Impedance spectroscopy , Conductivity , BiCuVOx , dielectric constant
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2007
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2145243
Link To Document :
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