High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam

Scanning X-ray microdiffraction (μSXRD) combines the use of high brilliance synchrotron sources with state-of-the-art achromatic X-ray focusing optics and large area detector technology. Using either white or monochromatic beams, it allows for orientation and strain/stress mapping of polycrystalline thin films with submicron spatial resolution. The present paper will focus on three applications performed at the Advanced Light Source: the study of local plasticity in aluminum thin films, the study of the spontaneous growth of tin whiskers in lead-free solder finish and the measurement of strain field around thin film bucklings.