Title of article
Atomic-scale details of dislocation–stacking fault tetrahedra interaction
Author/Authors
Osetsky، نويسنده , , Yu. N. and Stoller، نويسنده , , R.E. and Rodney، نويسنده , , D. and Bacon، نويسنده , , D.J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
4
From page
370
To page
373
Abstract
Stacking fault tetrahedra (SFTs) are formed during irradiation of f.c.c. metals and alloys with low stacking fault energy. The high number density of SFTs observed suggests that they should contribute to radiation-induced hardening and, therefore, be taken into account when estimating mechanical property changes of irradiated materials. The key issue is to describe the interaction between a moving dislocation and an individual SFT, which is characterized by a small physical scale of about 100 nm. In this paper we present results of an atomistic simulation of edge and screw dislocations interacting with small SFTs at different temperatures and strain rates and present mechanisms which can explain the formation of defect-free channels observed experimentally.
Keywords
Dislocation , Stacking fault tetrahedra , Defect-free channels
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2005
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2147237
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