Thickness dependence of transformation characteristics of Ni–Mn–Ga thin films deposited on alumina: Experiment and modeling

A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni–Mn–Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.