Author/Authors :
Gao، نويسنده , , Y.Q. and Huang، نويسنده , , Z.M. and Hou، نويسنده , , Y. and Wu، نويسنده , , J. and Zhou، نويسنده , , W. and OuYang، نويسنده , , C. and Huang، نويسنده , , J.G. and Tong، نويسنده , , J.C. and Chu، نويسنده , , J.H.، نويسنده ,
Abstract :
High quality Mn1.56Co0.96Ni0.48O4 (MCN) films have been prepared by chemical solution deposition method. The microstructure and electrical properties of the films are investigated with different layers. Both the crystalline quality and the grain size improve when the film layers increase. The theoretical lattice constant acal is slightly smaller compared with the XRD experiment results afilm. The temperature dependence of resistivity can be described by a variable range hopping model for a parabolic density of states. With the increase of film layers, the sensitivity and stability of the MCN films increase. The advantage of good negative temperature coefficient thermistor characteristic makes the MCN films very preponderant for thermal sensors.
Keywords :
Mn1.56Co0.96Ni0.48O4 films , Thermal sensors , Sensitivity and stability , Structural and electrical properties
