• Title of article

    Simulation of electron holographic contour maps of linear charged dislocations

  • Author/Authors

    Cavalcoli، نويسنده , , Scott D. and Matteucci، نويسنده , , G. and Muccini، نويسنده , , M.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 1995
  • Pages
    6
  • From page
    385
  • To page
    390
  • Abstract
    The possibility to reveal the electric potential distribution arising from straight charged dislocations in silicon by means of electron holography techniques in the transmission mode is considered. Using the Read model for a charged dislocation two experimental arrangements are investigated with the line charge parallel or perpendicular to the electron beam. Although contour maps should be revealable with both set-ups, it turns out that the second case is more versatile and suitable for displaying the dislocation charge. Beam injection conditions are also discussed.
  • Journal title
    Ultramicroscopy
  • Serial Year
    1995
  • Journal title
    Ultramicroscopy
  • Record number

    2154314