Title of article
Simulation of electron holographic contour maps of linear charged dislocations
Author/Authors
Cavalcoli، نويسنده , , Scott D. and Matteucci، نويسنده , , G. and Muccini، نويسنده , , M.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1995
Pages
6
From page
385
To page
390
Abstract
The possibility to reveal the electric potential distribution arising from straight charged dislocations in silicon by means of electron holography techniques in the transmission mode is considered. Using the Read model for a charged dislocation two experimental arrangements are investigated with the line charge parallel or perpendicular to the electron beam. Although contour maps should be revealable with both set-ups, it turns out that the second case is more versatile and suitable for displaying the dislocation charge. Beam injection conditions are also discussed.
Journal title
Ultramicroscopy
Serial Year
1995
Journal title
Ultramicroscopy
Record number
2154314
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