Title of article :
Interference effects in inelastic thickness fringes
Author/Authors :
Nelhiebel، نويسنده , , M. and Schenner، نويسنده , , M. and Schattschneider، نويسنده , , P.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1996
Pages :
9
From page :
173
To page :
181
Abstract :
We discuss the double differential scattering cross section for atomic inner-shell excitations in crystals. We emphasize interference effects and demonstrate them by means of energy-filtered images of silicon monocrystals under two-beam diffraction conditions. In particular, we measure thickness fringes.
Journal title :
Ultramicroscopy
Serial Year :
1996
Journal title :
Ultramicroscopy
Record number :
2154727
Link To Document :
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