Synthesis of analytical and high-resolution transmission electron microscopy to determine the interface structure of Cu/Al2O3

The structure of Cu/Al2O3 interfaces has been studied by high-resolution transmission electron microscopy (HRTEM) and analytical TEM. The use of electron energy-loss spectroscopy (EELS) in the determination of the local coordinations and bonding mechanisms at the interface is shown to be an essential extension for atomic structure evaluation by quantitative high-resolution TEM. A refined atomic model of the Cu/Al2O3 interface is then retrieved by iterative digital image matching. Multiple scattering calculations based on this model are vital to explain the interface specific components in the EELS O-K edge. The atomistic configuration at the interface is described by a structure model with CuO bonds across the interface.