Title of article :
EXELFS χ-data renormalization
Author/Authors :
Qian، نويسنده , , Maoxu and Sarikaya، نويسنده , , Mehmet and Stern، نويسنده , , Edward A.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1997
Abstract :
In this paper, a procedure developed for accurate modeling of the background of core edges in electron energy loss spectroscopy (EELS) is described. This procedure is necessary for improving data analysis technique used in extended energy loss fine structure (EXELFS) spectroscopy via the adaptation of X-ray absorption fine structure (XAFS) analysis programs. With the improved background modeling, it now becomes possible to renormalize the EXELFS χ-data and to ensure the correct use of the XAFS programs for EXELFS analysis.
Keywords :
Extended energy loss fine structure (EXELFS) spectroscopy , Transmission electron microscopy (TEM) , ?-data , X-ray absorption fine structure (XAFS) analysis , Near neighbor , Debye-Waller factor , Electron energy loss spectroscopy (EELS)
Journal title :
Ultramicroscopy
Journal title :
Ultramicroscopy