Title of article
Properties of sputter-deposited Ni–Mn–Ga thin films
Author/Authors
Chernenko، نويسنده , , V.A. and Besseghini، نويسنده , , S. and Hagler، نويسنده , , M. and Müllner، نويسنده , , P. and Ohtsuka، نويسنده , , M. and Stortiero، نويسنده , , F.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
4
From page
271
To page
274
Abstract
Sub-micrometer Ni–Mn–Ga films on MgO(0 0 1) single-crystalline wafers have been prepared by radio-frequency magnetron sputtering. The structural and magnetic states of the as-received (quasi-amorphous phase) and annealed (highly ordered martensitic phase at T = 300 K) films have been examined by X-ray diffraction, and measurements of resistivity and magnetization. The annealed films demonstrate a transformation behavior typical for the bulk and show a thickness dependence of the magnetic properties.
Keywords
MgO(0 , 0 , Ni–Mn–Ga thin film , Martensitic transformation , Magnetic anisotropy , 1) wafer
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2008
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2154839
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