Quantitative determination of lattice parameters from CBED patterns: accuracy and performance

The algorithm developed by Rozeveld and Howe [Ultramicroscopy 50 (1993) 41–56] to determine multiple lattice parameters from convergent-beam electron diffraction patterns has been implemented and tested. As an example, the lattice parameters of a dispersion-strengthened aluminium specimen with triclinic distortions were extracted. The accuracy of the procedure is discussed in detail. It can be increased considerably if dynamic instead of kinematic simulations are used. However, a unique solution for the complete set of lattice parameters does not exist within the experimental accuracy.