Title of article
Microstructured polymer tips for scanning near-field optical microscopy
Author/Authors
Stürmer، نويسنده , , Herbert and Michael Kِhler، نويسنده , , J and M. Jovin، نويسنده , , Thomas، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1998
Pages
4
From page
107
To page
110
Abstract
A new technique for producing polymeric cantilevers with integrated tips for combined scanning-force microscopy/scanning near-field optical microscopy is described in this paper. By integration reactive ion etched polymeric and fluorescent tips to polymer-based cantilevers, it will become possible to produce apertureless sensors for a scanning near-field optical microscope with the well-known atomic-force distance control.
Keywords
atomic force microscopy , Reactive Ion Etching , Polymer tips , Scanning probe microscopy , Scanning near-field optical microscopy
Journal title
Ultramicroscopy
Serial Year
1998
Journal title
Ultramicroscopy
Record number
2154890
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