Title of article :
Monte Carlo simulations of coaxial backscattered electrons in SEM
Author/Authors :
Rosenberg، نويسنده , , N. and Jiang، نويسنده , , C.Z. and Morin، نويسنده , , P.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1999
Pages :
9
From page :
97
To page :
105
Abstract :
We simulate the trajectories of backscattered electrons within a SEM of particular detection geometry which is adapted to topographic contrast attenuation and Z atomic number contrast enhancement. The calculations are performed choosing the different experimentally possible conditions as regards the primary electron energy, the detector aperture angle and the energy window of the detected electrons. From such simulations, it is possible to deduce the backscattering coefficient and consequently the conditions which optimize the Z analysis, particularly in order to avoid confusion between Z and topographic contrast.
Keywords :
Reflection electron microscopy (REM) , Scanning electron microscopy (SEM)
Journal title :
Ultramicroscopy
Serial Year :
1999
Journal title :
Ultramicroscopy
Record number :
2155124
Link To Document :
بازگشت