Improvements in the reconstruction of in-line holograms by energy sampling and tomography: II

Depth resolution in the reconstruction of in-line holograms taken with the low-energy electron point source (LEEPS) microscope is improved by employing, on the basis of a Kirchhoff–Helmholtz-type reconstruction integral, (i) a tomographic approach, sampling several screen positions, and (ii) a weighted energy averaging. The improved reconstructions exhibit atomic resolution both laterally and in depth. We use an analytical approach to average over a selected range of screen positions to obtain such improved reconstructions. We investigate how the improvement depends on the range of screen positions and on screen size.