• Title of article

    Three-dimensional atomic scale microscopy with the atom probe

  • Author/Authors

    Menand، نويسنده , , A and Cadel، نويسنده , , E and Pareige، نويسنده , , C and Blavette، نويسنده , , D، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 1999
  • Pages
    10
  • From page
    63
  • To page
    72
  • Abstract
    A new type of high resolution nanoanalytical microscope, the three-dimensional atom-probe, has been recently developed. The tomographic atom-probe (TAP) developed in our laboratory provides three-dimensional maps of chemical heterogeneities in a metallic material on a near-atomic scale. The basic principle of this new generation apparatus relies on the field evaporation and ionisation of atoms from the material. Chemical species are identified by time-of-flight mass spectrometry. The position of atoms at the specimen surface is determined with the aid of a specially designed position-sensitive multidetector. In this paper the high spatial resolution of the TAP is illustrated through some metallurgical examples by studying the very early stages of unmixing and ordering reactions and the mapping of interfacial segregations.
  • Keywords
    Interfacial segregation , 3D atom-probe , Analytical microscopy , Unmixing , long-range order
  • Journal title
    Ultramicroscopy
  • Serial Year
    1999
  • Journal title
    Ultramicroscopy
  • Record number

    2155188