• Title of article

    Solid nitrogen: electron microscopy and beam damage quantification at 4 K

  • Author/Authors

    Zemlin، نويسنده , , F and Beckmann، نويسنده , , E and Charlé، نويسنده , , K.-P and Schatz، نويسنده , , M and Schlِgl، نويسنده , , R، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 1999
  • Pages
    9
  • From page
    153
  • To page
    161
  • Abstract
    Well-shaped single crystals of nitrogen were prepared on a carbon film by adiabatic expansion of liquid nitrogen. The crystal structure was investigated by electron diffraction and high-resolution imaging using a helium-cooled, superconducting electron microscope. The crystals turned out to be α-nitrogen with face centred cubic structure as described in literature. Radiation damage results in a loss of crystallinity and mass. The mass loss was determined at different acceleration voltages. Twenty-three electrons with 160 keV energy were necessary to release one nitrogen molecule. Within a margin of error this number decreases proportionally to decreasing electron energy.
  • Keywords
    Nitrogen , Solid gas , Electron microscopy , Radiation damage
  • Journal title
    Ultramicroscopy
  • Serial Year
    1999
  • Journal title
    Ultramicroscopy
  • Record number

    2155306