Title of article :
Solid nitrogen: electron microscopy and beam damage quantification at 4 K
Author/Authors :
Zemlin، نويسنده , , F and Beckmann، نويسنده , , E and Charlé، نويسنده , , K.-P and Schatz، نويسنده , , M and Schlِgl، نويسنده , , R، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1999
Abstract :
Well-shaped single crystals of nitrogen were prepared on a carbon film by adiabatic expansion of liquid nitrogen. The crystal structure was investigated by electron diffraction and high-resolution imaging using a helium-cooled, superconducting electron microscope. The crystals turned out to be α-nitrogen with face centred cubic structure as described in literature. Radiation damage results in a loss of crystallinity and mass. The mass loss was determined at different acceleration voltages. Twenty-three electrons with 160 keV energy were necessary to release one nitrogen molecule. Within a margin of error this number decreases proportionally to decreasing electron energy.
Keywords :
Nitrogen , Solid gas , Electron microscopy , Radiation damage
Journal title :
Ultramicroscopy
Journal title :
Ultramicroscopy