Title of article :
Dose-rate dependence of electron-induced mass loss from organic specimens
Author/Authors :
Egerton، نويسنده , , R.F and Rauf، نويسنده , , I، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1999
Pages :
8
From page :
247
To page :
254
Abstract :
Electron energy-loss measurements on thin films of collodion at low temperatures (90 K) show that the characteristic electron dose De for mass loss first increases and then decreases with increasing dose rate (current density). This behaviour is explained in terms of the limited diffusion rates at low specimen temperature and the heating effect of the electron beam, and can be approximately modelled using a simple computer program. For a small-diameter electron probe, the increase in De can be several orders of magnitude, suggesting a substantial advantage of STEM (in comparison to fixed-beam TEM) for examining beam-sensitive specimens.
Keywords :
Radiation effects (experimental) , Electron energy loss spectroscopy (EELS)
Journal title :
Ultramicroscopy
Serial Year :
1999
Journal title :
Ultramicroscopy
Record number :
2155315
Link To Document :
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