Title of article :
Rietveld analysis of electron powder diffraction data from nanocrystalline anatase, TiO2
Author/Authors :
Weirich، نويسنده , , Th.E and Winterer، نويسنده , , M and Seifried، نويسنده , , S and Hahn، نويسنده , , H and Fuess، نويسنده , , H، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2000
Abstract :
The structure of nanocrystalline anatase (TiO2) was successfully refined from electron powder diffraction data using the Rietveld technique. A polycrystalline sample (average crystal size about 70 إ) was characterised by selected area electron diffraction in a conventional transmission electron microscope operated at 300 kV. Radially integrated intensities were extracted from digitised photographic films and used in the course of structure refinements by a standard program for Rietveld analysis. The structure was refined in space group I41/amd (#141) with lattice parameters a=3.7710(9) إ and c=9.430(2) إ. The reliability factors of the refinement are Rwp=5.2% and RB=2.6%. The close agreement of the refined structural parameters with previous results obtained from neutron diffraction on coarse-grained powders proves the applicability of the method for characterising nanocrystalline powders. The present study shows that Rietveld analysis on electron powder data is a good compliment to the existing methods for accurate structural investigations on nanocrystalline materials and thin films.
Keywords :
Electron power diffraction , Rietveld refinement , Nanocrystalline anatase
Journal title :
Ultramicroscopy
Journal title :
Ultramicroscopy