• Title of article

    Data analysis of interaction forces measured with the atomic force microscope

  • Author/Authors

    Baumgartner، نويسنده , , W. and Hinterdorfer، نويسنده , , Simon P. and Schindler، نويسنده , , H.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2000
  • Pages
    11
  • From page
    85
  • To page
    95
  • Abstract
    The force-distance cycle mode of the atomic force microscope (AFM) allows for detection of interaction forces between the AFM-tip and a substrate (probe). This can either be a direct tip–sample interaction or an interaction between molecules coupled to the tip and probe, respectively. The interaction forces are typically in the range of a few pN to some hundred pN. In this article we describe algorithms for the analysis of force–distance cycles, to quantify interaction forces between tip and probe. Both, the direct tip–probe interaction as well as the interaction between specifically bound molecules are analyzed. The molecules bound to tip and probe have to be either long and flexible or have to be bound via a flexible cross linker. The algorithms are exemplified on direct tip–probe interactions and on unbinding events of cadherins which are bound via PEG-spacers to the AFM-tip and to the probe.
  • Keywords
    AFM , atomic force microscopy , force spectroscopy , Unbinding
  • Journal title
    Ultramicroscopy
  • Serial Year
    2000
  • Journal title
    Ultramicroscopy
  • Record number

    2155383