Title of article :
Thermal noise reduction of mechanical oscillators by actively controlled external dissipative forces
Author/Authors :
Liang، نويسنده , , Shoudan and Medich، نويسنده , , David and Czajkowsky، نويسنده , , Daniel M and Sheng، نويسنده , , Sitong and Yuan، نويسنده , , Jian-Yang and Shao، نويسنده , , Zhifeng، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2000
Pages :
7
From page :
119
To page :
125
Abstract :
We show that the thermal fluctuations of very soft mechanical oscillators, such as the cantilever in an atomic force microscope (AFM), can be reduced without changing the stiffness of the spring or having to lower the environment temperature. We derive a theoretical relationship between the thermal fluctuations of an oscillator and an actively controlled external dissipative force. This relationship is verified by experiments with an AFM cantilever where the external active force is coupled through a magnetic field. With simple instrumentation, we have reduced the thermal noise amplitude of the cantilever by a factor of 3.4, achieving an apparent temperature of 25 K with the environment at 295 K. This active noise reduction approach can significantly improve the accuracy of static position or static force measurements in a number of practical applications.
Keywords :
RMS noise , Dissipation , Force
Journal title :
Ultramicroscopy
Serial Year :
2000
Journal title :
Ultramicroscopy
Record number :
2155482
Link To Document :
بازگشت