Title of article
Determination of the orientation in small areas of the exit wave
Author/Authors
Bokel، نويسنده , , R.M.J. and Jansen، نويسنده , , J and Zandbergen، نويسنده , , H.W، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2001
Pages
8
From page
89
To page
96
Abstract
Local differences in thickness and misorientation in a through-focus reconstructed exit wave hamper direct interpretation. These local thicknesses and misorientations can be refined on an atomic scale using the intensities of the Fourier components with the refinement procedure in which a least-squares refinement is combined with a multi-slice calculation. The method was applied to the superconductor La3Ni2B2N3. The crystal tilt and specimen thickness can be determined with an R-value of 8–25%, with a better R-value for thinner areas. Significant differences in the refined tilts, thicknesses and R-values are observed when reconstructed exit waves that are corrected for mechanical vibration are compared with reconstructed exit waves, which are uncorrected.
Keywords
high-resolution transmission electron microscopy , Exit-wave reconstruction , Electron microscope design and characterisation
Journal title
Ultramicroscopy
Serial Year
2001
Journal title
Ultramicroscopy
Record number
2155621
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