Title of article :
Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?
Author/Authors :
Van Dyck، نويسنده , , D. and Van Aert، نويسنده , , S. and den Dekker، نويسنده , , A.J. and van den Bos، نويسنده , , A.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2003
Abstract :
Atomic resolution transmission electron microscopy, even with an aberration free microscope, is only able to resolve and refine amorphous structures at the atomic level for very small foil thicknesses. Then, a precision of the order of 0.01 Å is possible, but this may require long recording times, especially for light atoms. For larger thicknesses, amorphous structures can in principle only be resolved and refined using electron tomography.
Keywords :
Amorphous structure , Transmission electron microscopy , atomic resolution , Precision , Parameter estimation , Electron tomography
Journal title :
Ultramicroscopy
Journal title :
Ultramicroscopy