Title of article :
Resolution extension and exit wave reconstruction in complex HREM
Author/Authors :
Hsieh، نويسنده , , Wen-Kuo and Chen، نويسنده , , Fu-Rong and Kai، نويسنده , , Ji-Jung and Kirkland، نويسنده , , A.I، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2004
Pages :
16
From page :
99
To page :
114
Abstract :
Direct methods in real and reciprocal space are developed for structural reversion. The direct method in real space involves the use of a novel method to retrieve the phase in the image plane using transport of intensity equation/maximum entropy method (TIE/MEM) and exit wave reconstruction by self-consistent propagation. Since the exit wave is restored from the complex signal in the image planes, no image model between the exit wave and image is assumed. The structural information in the reconstructed exit wave is then further extended by a “complex” maximum entropy method as a direct method in reciprocal space to extrapolate the phase to higher frequencies.
Keywords :
Complex MEM , High resolution TEM , Non-Interferometry , phase retrieval , Exit wave reconstruction , Transport of intensity equation (TIE)
Journal title :
Ultramicroscopy
Serial Year :
2004
Journal title :
Ultramicroscopy
Record number :
2156286
Link To Document :
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