• Title of article

    Surface crystallography via electron microscopy

  • Author/Authors

    Subramanian، نويسنده , , A. and Marks، نويسنده , , L.D.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2004
  • Pages
    7
  • From page
    151
  • To page
    157
  • Abstract
    The study of atomic structure of surfaces is fundamental to the understanding of electronic, chemical and mechanical properties of surfaces and numerous techniques have been developed to this end. Transmission Electron Microscopy techniques, namely transmission electron imaging (TEM) and diffraction (TED), due to their ability to provide structural information at very high resolutions, have emerged as powerful tools for the study of surface structure. In this article we review the experimental method alongside the various post-processing routines that are necessary to extract vital structural information from experimental data.
  • Keywords
    Transmission electron microscopy , Electron diffraction , Surface relaxation and reconstruction , image processing , computer simulations , Direct methods
  • Journal title
    Ultramicroscopy
  • Serial Year
    2004
  • Journal title
    Ultramicroscopy
  • Record number

    2156292