Title of article :
Electron diffraction analysis of individual single-walled carbon nanotubes
Author/Authors :
Meyer، نويسنده , , Jannik C. and Paillet، نويسنده , , Matthieu and Duesberg، نويسنده , , Georg S. and Roth، نويسنده , , Siegmar، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2006
Pages :
15
From page :
176
To page :
190
Abstract :
We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60 kV , below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects.
Keywords :
Nanotube and TEM sample preparation , Electron diffraction , Carbon nanotubes
Journal title :
Ultramicroscopy
Serial Year :
2006
Journal title :
Ultramicroscopy
Record number :
2156628
Link To Document :
بازگشت