• Title of article

    Precession technique and electron diffractometry as new tools for crystal structure analysis and chemical bonding determination

  • Author/Authors

    Avilov، نويسنده , , A. and Kuligin، نويسنده , , K. and Nicolopoulos، نويسنده , , S. and Nickolskiy، نويسنده , , M. and Boulahya، نويسنده , , K. and Portillo، نويسنده , , J. and Lepeshov، نويسنده , , G. A. Sobolev، نويسنده , , B. and Collette، نويسنده , , J.P. and Martin، نويسنده , , N. S. Robins، نويسنده , , A.C. and Fischione، نويسنده , , P.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2007
  • Pages
    14
  • From page
    431
  • To page
    444
  • Abstract
    We have developed a new fast electron diffractometer working with high dynamic range and linearity for crystal structure determinations. Electron diffraction (ED) patterns can be scanned serially in front of a Faraday cage detector; the total measurement time for several hundred ED reflections can be tens of seconds having high statistical accuracy for all measured intensities (1–2%). This new tool can be installed to any type of TEM without any column modification and is linked to a specially developed electron beam precession “Spinning Star” system. Precession of the electron beam (Vincent–Midgley technique) reduces dynamical effects allowing also use of accurate intensities for crystal structure analysis. We describe the technical characteristics of this new tool together with the first experimental results. Accurate measurement of electron diffraction intensities by electron diffractometer opens new possibilities not only for revealing unknown structures, but also for electrostatic potential determination and chemical bonding investigation. As an example, we present detailed atomic bonding information of CaF2 as revealed for the first time by precise electron diffractometry.
  • Keywords
    Electron diffractometer , Electron beam precession , Chemical bonding , Electrostatic potential distribution
  • Journal title
    Ultramicroscopy
  • Serial Year
    2007
  • Journal title
    Ultramicroscopy
  • Record number

    2156893