Title of article :
Electron channelling based crystallography
Author/Authors :
Van Aert، نويسنده , , S. and Geuens، نويسنده , , P. and Van Dyck، نويسنده , , D. and Kisielowski، نويسنده , , C. and Jinschek، نويسنده , , J.R.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2007
Pages :
8
From page :
551
To page :
558
Abstract :
Electron channelling occurs when the incident electron beam is parallel to the atom columns of an object, such as a crystal or a particular crystal defect. Then, the electrons are trapped in the electrostatic potential of an atom column in which they scatter dynamically. This picture provides physical insight and explains why a one-to-one correspondence is maintained between the exit wave and the projected structure, even in case of strong dynamical scattering. Moreover, the theory is very useful to invert the dynamical scattering, that is, to derive the projected structure from the exit wave. Finally, it can be used to determine the composition of an atom column with single atom sensitivity or to explain dynamical electron diffraction effects. In this paper, an overview of the channelling theory will be given together with some recent applications.
Keywords :
Electron diffraction and elastic scattering theory , Reflection and scanning electron microscopy , Theories of diffraction and scattering , image simulation , Transmission
Journal title :
Ultramicroscopy
Serial Year :
2007
Journal title :
Ultramicroscopy
Record number :
2156917
Link To Document :
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