Title of article
Characterization of Alq3 thin films by a near-field microwave microprobe
Author/Authors
Hovsepyan، نويسنده , , Artur and Lee، نويسنده , , Huneung and Sargsyan، نويسنده , , Tigran and Melikyan، نويسنده , , Harutyun and Yoon، نويسنده , , Youngwoon and Babajanyan، نويسنده , , Arsen and Friedman، نويسنده , , Barry and Lee، نويسنده , , Kiejin، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2008
Pages
4
From page
1058
To page
1061
Abstract
We observed tris-8-hydroxyquinoline aluminum (Alq3) thin films dependence on substrate heating temperatures by using a near-field microwave microprobe (NFMM) and by optical absorption at wavelengths between 200 and 900 nm. The changes of absorption intensity at different substrate heating temperatures are correlated to the changes in the sheet resistance of Alq3 thin films.
Keywords
heating , near field , Alq3 , ABSORPTION , Microwave microprobe
Journal title
Ultramicroscopy
Serial Year
2008
Journal title
Ultramicroscopy
Record number
2157272
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