Title of article :
Characterization of Alq3 thin films by a near-field microwave microprobe
Author/Authors :
Hovsepyan، نويسنده , , Artur and Lee، نويسنده , , Huneung and Sargsyan، نويسنده , , Tigran and Melikyan، نويسنده , , Harutyun and Yoon، نويسنده , , Youngwoon and Babajanyan، نويسنده , , Arsen and Friedman، نويسنده , , Barry and Lee، نويسنده , , Kiejin، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2008
Pages :
4
From page :
1058
To page :
1061
Abstract :
We observed tris-8-hydroxyquinoline aluminum (Alq3) thin films dependence on substrate heating temperatures by using a near-field microwave microprobe (NFMM) and by optical absorption at wavelengths between 200 and 900 nm. The changes of absorption intensity at different substrate heating temperatures are correlated to the changes in the sheet resistance of Alq3 thin films.
Keywords :
heating , near field , Alq3 , ABSORPTION , Microwave microprobe
Journal title :
Ultramicroscopy
Serial Year :
2008
Journal title :
Ultramicroscopy
Record number :
2157272
Link To Document :
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