Title of article :
Exploration of the ultimate patterning potential achievable with focused ion beams
Author/Authors :
Gierak، نويسنده , , J. and Bourhis، نويسنده , , E. and Faini، نويسنده , , G. and Patriarche، نويسنده , , G. and Madouri، نويسنده , , A. and Jede، نويسنده , , R. and Bruchhaus، نويسنده , , L. and Bauerdick، نويسنده , , S. and Schiedt، نويسنده , , B. and Biance، نويسنده , , A.L. and Auvray، نويسنده , , L.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2009
Pages :
6
From page :
457
To page :
462
Abstract :
Decisive advances in the field of nanosciences and nanotechnologies are intimately related to the development of new instruments and of related writing schemes and methodologies. Therefore we have recently proposed the exploitation of the nano-structuring potential of a highly focused ion beam (FIB) as a tool, to overcome intrinsic limitations of current nano-fabrication techniques and to allow innovative patterning schemes that are urgently needed in many nanoscience challenges. In this work, we will first detail a very high-resolution FIB instrument we have developed specifically to meet these nano-fabrication requirements. Then we will introduce and illustrate an advanced FIB processing scheme that is the fabrication of artificial nanopores.
Keywords :
Nano-patterning , Focused ion beam , SiC membrane , nanopore
Journal title :
Ultramicroscopy
Serial Year :
2009
Journal title :
Ultramicroscopy
Record number :
2157544
Link To Document :
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