Title of article :
Laser-assisted atom probe analysis of sol–gel silica layers
Author/Authors :
Gruber، نويسنده , , M. and Oberdorfer، نويسنده , , C. and Stender، نويسنده , , P. and Schmitz، نويسنده , , G.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2009
Pages :
6
From page :
654
To page :
659
Abstract :
Semi-conducting nanocrystals embedded in a non-conducting matrix of silicate glass may be used as non-volatile data storage device. Structures of silicate glasses are conveniently produced by a sol–gel process, which offers the possibility to coat tip-shaped substrates with a silica layer. The study presents first results of their local chemical analysis by laser-assisted atom probe. Till date the exact mechanisms of laser pulsing are still controversial. But it is common sense that there is an at least considerable heating effect on the tip, which leads to a short temperature rise and a prolonged cooling period in materials of low heat conductivity. This effect alters the shape of mass peaks and is examined here using a one-dimensional model of heat transport.
Keywords :
Sol–gel process , silica , Laser pulsing , Atom probe tomography
Journal title :
Ultramicroscopy
Serial Year :
2009
Journal title :
Ultramicroscopy
Record number :
2157594
Link To Document :
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