Title of article :
Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy
Author/Authors :
Gu، نويسنده , , Lin and Sigle، نويسنده , , Wilfried and Koch، نويسنده , , Christoph T. and Nelayah، نويسنده , , Jaysen and Srot، نويسنده , , Vesna and van Aken، نويسنده , , Peter A.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2009
Pages :
7
From page :
1164
To page :
1170
Abstract :
The advent of electron monochromators has opened new perspectives on electron energy-loss spectroscopy at low energy losses, including phenomena such as surface plasmon resonances or electron transitions from the valence to the conduction band. In this paper, we report first results making use of the combination of an energy filter and a post-filter annular dark-field detector. This instrumental design allows us to obtain energy-filtered (i.e. inelastic) annular dark-field images in scanning transmission electron microscopy of the 2-dimensional semiconductor band-gap distribution of a GaN/Al45Ga55N structure and of surface plasmon resonances of silver nanoprisms. In comparison to other approaches, the technique is less prone to inelastic delocalization and relativistic artefacts. The mixed contribution of elastic and inelastic contrast is discussed.
Keywords :
Band-gap , eels , EF-STEM , EFTEM
Journal title :
Ultramicroscopy
Serial Year :
2009
Journal title :
Ultramicroscopy
Record number :
2157699
Link To Document :
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