Title of article :
Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)
Author/Authors :
Wang، نويسنده , , Feng and Egerton، نويسنده , , Ray and Malac، نويسنده , , Marek، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2009
Abstract :
We discuss several ways of using Fourier-ratio deconvolution to process low-loss spectra. They include removal of the tail arising from the zero-loss peak, extraction of the spectrum of a particle from data recorded from the particle on a substrate, separation of the bulk and surface components in spectra recorded from samples of the same composition but different thickness, and investigation of interface energy-loss modes. We also demonstrate the use of a Bayesian-equivalent procedure based on the Richardson–Lucy algorithm.
Keywords :
Fourier-ratio deconvolution , Plural scattering , Richardson–Lucy (RL) deconvolution , Electron energy-loss spectroscopy (EELS) , Bulk plasmon , Surface plasmon , Interface plasmon
Journal title :
Ultramicroscopy
Journal title :
Ultramicroscopy