Title of article
Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics
Author/Authors
Kewish، نويسنده , , Cameron M. and Thibault، نويسنده , , Pierre and Dierolf، نويسنده , , Martin and Bunk، نويسنده , , Oliver and Menzel، نويسنده , , Andreas and Vila-Comamala، نويسنده , , Joan and Jefimovs، نويسنده , , Konstantins and Pfeiffer، نويسنده , , Franz، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2010
Pages
5
From page
325
To page
329
Abstract
A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics.
Keywords
Wavefront characterization , X-ray optics , Diffractive imaging , phase retrieval , Ptychography
Journal title
Ultramicroscopy
Serial Year
2010
Journal title
Ultramicroscopy
Record number
2157828
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