• Title of article

    Long-range correlations in investigated by DFT calculations and electron holography

  • Author/Authors

    Rِder، نويسنده , , Falk and Lubk، نويسنده , , Axel and Lichte، نويسنده , , Hannes and Bredow، نويسنده , , Thomas and Yu، نويسنده , , Wentao and Mader، نويسنده , , Werner، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2010
  • Pages
    11
  • From page
    400
  • To page
    410
  • Abstract
    The system In 2 O 3 ( ZnO ) 7 exhibits a strained ZnO-like domain structure intersected by indium containing, parallely arranged defect planes with a regular spacing of about 2.4 nm. We propose that the strain within the domains originates from long-range electric fields due to charge localization at the defects inducing ionic displacements. The origin of the electric fields has been investigated theoretically by means of density functional theory (DFT). Calculated electric fields were incorporated as scattering potentials in holographic imaging simulations. Since the exact structure of the system is unknown, a novel structure model was derived for In 2 O 3 ( ZnO ) 7 from known members of the homologous series of In 2 O 3 ( ZnO ) m with m = 3 , 5 and refined by structure optimization at DFT level. The theoretical results are compared to experimental findings in high-resolution phase images obtained by means of electron holography, which suggest residual intrinsic electric fields. A careful consideration of noise levels and the influence of the microscope, however, show that the electric field signal is at the detection limit of state-of-the-art high-resolution electron holography.
  • Keywords
    Electron holography , DFT , Imaging simulations , Intrinsic electric fields , Long-range correlations
  • Journal title
    Ultramicroscopy
  • Serial Year
    2010
  • Journal title
    Ultramicroscopy
  • Record number

    2157841