Title of article :
Reply to comment by Maurice et al. in response to “Bragg’s Law Diffraction Simulations for Electron Backscatter Diffraction Analysis”
Author/Authors :
Kacher، نويسنده , , Josh and Basinger، نويسنده , , Jay L. Adams ، نويسنده , , Brent L. and Fullwood، نويسنده , , David T.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2010
Pages :
3
From page :
760
To page :
762
Abstract :
A reply to Maurice et al.ʹs comment on "Braggʹs Law Diffraction Simulations for Electron Backscatter Diffraction" is presented. A new method for microscope geometry calibration is briefly presented. Also, evidence that simple diffraction simulations can be profitable tools for absolute elastic strain measurements in crystalline materials is reiterated.
Keywords :
Scanning electron microscope , strain , EBSD
Journal title :
Ultramicroscopy
Serial Year :
2010
Journal title :
Ultramicroscopy
Record number :
2157927
Link To Document :
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