Bilateral filter based orientation smoothing of EBSD data

Bilateral filter based orientation smoothing was implemented in this study to improve the angular precision of orientation maps for deposited and deformed structures of pure Cu obtained from electron backscattered diffraction (EBSD) measurements. Applying the method to the deformed and deposited structures, the accuracy of misorientation (or the limit of orientation noise) is enhanced from 0.7° to 0.25° and 0.07°, respectively. Orientation smoothing has two features: preservation of boundary structures or deformed substructures and significant reduction in orientation noise after only one pass.