Title of article :
Design of an aberration corrected low-voltage SEM
Author/Authors :
van Aken، نويسنده , , R.H. and Maas، نويسنده , , D.J. and Hagen، نويسنده , , C.W. and Barth، نويسنده , , J.E and Kruit، نويسنده , , P.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2010
Pages :
9
From page :
1411
To page :
1419
Abstract :
The low-voltage foil corrector is a novel type of foil aberration corrector that can correct for both the spherical and chromatic aberration simultaneously. In order to give a realistic example of the capabilities of this corrector, a design for a low-voltage scanning electron microscope with the low-voltage foil corrector is presented. A fully electrostatic column has been designed and characterised by using aberration integrals and ray tracing calculations. The amount of aberration correction can be adjusted relatively easy. The third order spherical and the first order chromatic aberration can be completely cancelled. In the zero current limit, a FW50 probe size of 1.0 nm at 1 kV can be obtained. This probe size is mainly limited by diffraction and by the fifth order spherical aberration.
Keywords :
Spherical aberration , Low voltage , low energy , SEM , foil , Aberration correction , Chromatic aberration
Journal title :
Ultramicroscopy
Serial Year :
2010
Journal title :
Ultramicroscopy
Record number :
2158055
Link To Document :
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