• Title of article

    Fabrication and characterization of APT specimens from high dose heavy ion irradiated materials

  • Author/Authors

    Miller، نويسنده , , M.K. and Zhang، نويسنده , , Y.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2011
  • Pages
    4
  • From page
    672
  • To page
    675
  • Abstract
    The next generations of advanced energy systems will require materials that can withstand high doses of irradiation at elevated temperatures. Therefore, a methodology has been developed for the fabrication of high-dose ion-irradiated atom probe tomography specimens at a specific dose with the use of a focused ion beam milling system. The method also enables the precise ion dose of the atom probe tomography specimen to be estimated from the local concentration of the implanted ions. The method has been successfully applied to the characterization of the distribution of nanoclusters in a radiation-tolerant 14YWT nanostructured ferritic steel under ion irradiation to doses up to 400 displacements per atom.
  • Keywords
    Atom probe tomography , ion irradiation , Radiation damage , Focused ion beam milling
  • Journal title
    Ultramicroscopy
  • Serial Year
    2011
  • Journal title
    Ultramicroscopy
  • Record number

    2158223