The role of Poissonʹs binomial distribution in the analysis of TEM images

Frankʹs observation that a TEM bright-field image acquired under non-stationary conditions can be modeled by the time integral of the standard TEM image model [J. Frank, Nachweis von objektbewegungen im lichtoptis- chen diffraktogramm von elektronenmikroskopischen auf- nahmen, Optik 30 (2) (1969) 171–180.] is re-derived here using counting statistics based on Poissonʹs binomial distribution. The approach yields a statistical image model that is suitable for image analysis and simulation.