Title of article :
Impact of directional walk on atom probe microanalysis
Author/Authors :
Gault، نويسنده , , B. and Danoix، نويسنده , , F. and Hoummada، نويسنده , , K. and Mangelinck، نويسنده , , D. and Leitner، نويسنده , , H.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2012
Pages :
10
From page :
182
To page :
191
Abstract :
In the atom probe microanalysis of steels, inconsistencies in the measured compositions of solutes (C, N) have often been reported, as well as their appearance as molecular ions. Here we propose that these issues might arise from surface migration of solute atoms over the specimen surface. Surface migration of solutes is evidenced by field-ion microscopy observations, and its consequences on atom probe microanalysis are detailed for a wide range of solute (P, Si, Mn, B, C and N). It is proposed that directional walk driven by field gradients over the specimen surface and thermally activated is the prominent effect.
Keywords :
ARTEFACT , Surface migration , Atom probe tomography
Journal title :
Ultramicroscopy
Serial Year :
2012
Journal title :
Ultramicroscopy
Record number :
2158500
Link To Document :
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