Title of article :
Direct structure inversion from exit waves. Part II: A practical example
Author/Authors :
Wang، نويسنده , , A. and Chen، نويسنده , , F.R. and Van Aert، نويسنده , , S. and Van Dyck، نويسنده , , D.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2012
Pages :
9
From page :
77
To page :
85
Abstract :
This paper is the second part of a two-part paper on direct structure inversion from exit waves. In the first part, a method has been proposed to quantitatively determine structure parameters with atomic resolution such as atom column positions, surface profile and the number of atoms in the atom columns. In this part, the theory will be demonstrated by means of a Au[110] exit wave reconstructed from a set of focal-series images. The procedures to analyze the experimentally reconstructed exit wave in terms of quantitative structure information are described in detail.
Keywords :
Channelling theory , structure determination , Argand plot , image processing , Electron scattering
Journal title :
Ultramicroscopy
Serial Year :
2012
Journal title :
Ultramicroscopy
Record number :
2158563
Link To Document :
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