Title of article :
Detector non-uniformity in scanning transmission electron microscopy
Author/Authors :
Findlay، نويسنده , , S.D. and LeBeau، نويسنده , , J.M.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2013
Pages :
9
From page :
52
To page :
60
Abstract :
A non-uniform response across scanning transmission electron microscope annular detectors has been found experimentally, but is seldom incorporated into simulations. Through case study simulations, we establish the nature and scale of the discrepancies which may arise from failing to account for detector non-uniformity. If standard detectors are used at long camera lengths such that the detector is within or near to the bright field region, we find errors in contrast of the order of 10%, sufficiently small for qualitative work but non-trivial as experiments become more quantitative. In cases where the detector has been characterized in advance, we discuss the detector response normalization and how it may be incorporated in simulations.
Keywords :
Detector efficiency. , High-angle annular dark field (HAADF) , Scanning transmission electron microscopy (STEM)
Journal title :
Ultramicroscopy
Serial Year :
2013
Journal title :
Ultramicroscopy
Record number :
2158698
Link To Document :
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