Author/Authors :
Wendelin Schnedler، نويسنده , , M. and Weidlich، نويسنده , , P.H. and Portz، نويسنده , , V. and Weber، نويسنده , , D. and Dunin-Borkowski، نويسنده , , R.E. and Ebert، نويسنده , , Ph.، نويسنده ,
Abstract :
A methodology for the correction of scanning probe microscopy image distortions is demonstrated. It is based on the determination of displacement vectors from the measurement of a calibration sample. By moving the pixels of the distorted scanning probe microscopy image along the displacement vectors an almost complete correction of the nonlinear, time independent distortions is achieved.
Keywords :
Scanning probe microscopy , Image distortions , Correction algorithm , Calibration
