Title of article :
Atom probe tomography of lithium-doped network glasses
Author/Authors :
Greiwe، نويسنده , , Gerd-Hendrik and Balogh، نويسنده , , Zoltan and Schmitz، نويسنده , , Guido، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2014
Pages :
5
From page :
51
To page :
55
Abstract :
Li-doped silicate and borate glasses are electronically insulating, but provide considerable ionic conductivity. Under measurement conditions of laser-assisted atom probe tomography, mobile Li ions are redistributed in response to high electric fields. In consequence, the direct interpretation of measured composition profiles is prevented. It is demonstrated that composition profiles are nevertheless well understood by a complex model taking into account the electronic structure of dielectric materials, ionic mobility and field screening. Quantitative data on band bending and field penetration during measurement are derived which are important in understanding laser-assisted atom probe tomography of dielectric materials.
Keywords :
Atom probe tomography , Band bending , Laser-assisted field evaporation , Dielectric Materials , Ionic Transport
Journal title :
Ultramicroscopy
Serial Year :
2014
Journal title :
Ultramicroscopy
Record number :
2159271
Link To Document :
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