Title of article :
Characterization of an indirect X-ray imaging detector by simulation and experiment
Author/Authors :
Doshi، نويسنده , , C. and van Riessen، نويسنده , , G. and Balaur، نويسنده , , E. and de Jonge، نويسنده , , M.D. and Peele، نويسنده , , A.G.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2015
Pages :
5
From page :
20
To page :
24
Abstract :
We describe a comprehensive model of a commercial indirect X-ray imaging detector that accurately predicts the detector point spread function and its dependence on X-ray energy. The model was validated by measurements using monochromatic synchrotron radiation and extended to polychromatic X-ray sources. Our approach can be used to predict the performance of an imaging detector and can be used to optimize imaging experiments with broad-band X-ray sources.
Keywords :
Experiment validation , Indirect imaging X-ray detector , Point spread function , Polychromatic source
Journal title :
Ultramicroscopy
Serial Year :
2015
Journal title :
Ultramicroscopy
Record number :
2159394
Link To Document :
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