Title of article
Anomalous large internal friction observed for nm-thick Ag film below room temperature
Author/Authors
Tanimoto، نويسنده , , H. and Fujiwara، نويسنده , , A. and Yamaura، نويسنده , , K. and Mizubayashi، نويسنده , , H.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
4
From page
291
To page
294
Abstract
The internal friction of a nm-thick Ag film deposited on a Si substrate was studied. In a sputter deposited (SD-) Ag film on wet-oxidized high-boron CZ-Si (WO-SiBCZ), pre-exposure of air(wet) brings about the 200–250 K twin peaks, and the warming up to 300 K in a vacuum causes disappearance of the twin peaks. The peak height of the 200–250 K twin peaks shows the maximum at the SD-Ag film thickness of about 80 nm. No or very low peaks are observed in all the SD-Ag films on hydrogen terminated (HT-) or thermally-oxidized Si substrates. The interface region between SD-Ag and WO-SiBCZ containing OH molecules is responsible for the 200–250 K twin peaks. The underlying mechanism of the peaks is not known at present.
Keywords
Internal friction , Interface , nanofilm , Hydroxyl , Ag film
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2009
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2160209
Link To Document