Title of article :
Dislocation substructure evolution on Al creep under the action of the weak electric potential
Author/Authors :
Gromov، نويسنده , , V.E and Ivanov، نويسنده , , Yu.F. and Stolboushkina، نويسنده , , O.A. and Konovalov، نويسنده , , S.V.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
4
From page :
858
To page :
861
Abstract :
The dislocation substructure evolution on Al creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the Al sample surface is accompanied by the increase of dislocation substructure self-organization degree.
Keywords :
Dislocations , fracture , Electron microscopy , aluminum
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Serial Year :
2010
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Record number :
2165800
Link To Document :
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