Title of article :
Model-based clustering for integrated circuit yield enhancement
Author/Authors :
Jung Yoon Hwang، نويسنده , , Way Kuo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Keywords :
stochastic processes , quality control
Journal title :
European Journal of Operational Research
Journal title :
European Journal of Operational Research
