Analysis of artifact with X-ray CT using energy band by photon counting CdTe detector

This report analyzes the imaging errors in what are called “artifacts” by a CdTe detector with the energy differentiation ability using the photon counting mode. The selection of specific energy level in each metal sample allows nominating the images with less artifact. In addition, inspection of μx is the supportive method to judge the energy level. Photon counting CdTe detector with the energy differentiation ability is a system that can provide the information of projection data at different energy bands to establish the accuracy image of any materials.